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	<title>Nima Maghari &#8211; UF Innovate</title>
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	<title>Nima Maghari &#8211; UF Innovate</title>
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		<title>Forte &#038; Maghari Patent “Universal Testing Technique” To Detect Counterfeit Chips</title>
		<link>https://innovate.research.ufl.edu/uf-researchers-patent-fics/</link>
		
		<dc:creator><![CDATA[Sara Dagen]]></dc:creator>
		<pubDate>Mon, 03 May 2021 00:00:00 +0000</pubDate>
				<category><![CDATA[News Brief]]></category>
		<category><![CDATA[UF Inventors]]></category>
		<category><![CDATA[cybersecurity]]></category>
		<category><![CDATA[Domenic Forte]]></category>
		<category><![CDATA[FICS Research]]></category>
		<category><![CDATA[Florida Institute for Cybersecurity]]></category>
		<category><![CDATA[Nima Maghari]]></category>
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					<description><![CDATA[An article recently published in the Academic Times profiled exciting new technology patented by researchers at the Florida Institute for Cybersecurity (FICS) Research which promises a new way to detect recycled (previously used) and counterfeit electronic parts, especially chips.]]></description>
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<p class="wp-block-paragraph">An article recently published in the Academic Times profiled exciting new technology <a href="https://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&amp;Sect2=HITOFF&amp;u=%2Fnetahtml%2FPTO%2Fsearch-adv.html&amp;r=1&amp;p=1&amp;f=G&amp;l=50&amp;d=PG01&amp;S1=20210081574&amp;OS=20210081574&amp;RS=20210081574" target="_blank" rel="noreferrer noopener">patented</a> by researchers at the <a href="https://fics.institute.ufl.edu" target="_blank" rel="noreferrer noopener">Florida Institute for Cybersecurity (FICS) Research</a> which promises a new way to detect recycled (previously used) and counterfeit electronic parts, especially chips. The technology created by ECE Associate Professor <a href="https://ufinnovate.technologypublisher.com/bio.aspx?id=53379" target="_blank" rel="noreferrer noopener">Domenic Forte</a> and ECE Associate Professor Nima Maghari makes supply chains more secure, protects consumer safety and runs at almost zero cost. Compared to current methods of detecting counterfeit hardware (chips, power supplies, electronics components, etc.), the proposed “universal testing technique” can be used on virtually all chips produced by all vendors and can be further improved by applying artificial intelligence algorithms in order to automate detection.</p>



Learn more about <a href="https://news.ece.ufl.edu/2021/04/13/forte-maghari-patent-universal-testing-technique-to-detect-counterfeit-chips/">Forte &amp; Maghari Patent “Universal Testing Technique” To Detect Counterfeit Chips.</a>



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